Casimir forces on a silicon micromechanical chip

被引:101
|
作者
Zou, J. [1 ,2 ]
Marcet, Z. [1 ,2 ]
Rodriguez, A. W. [3 ,4 ]
Reid, M. T. H. [5 ]
McCauley, A. P. [6 ]
Kravchenko, I. I. [7 ]
Lu, T. [2 ]
Bao, Y. [1 ]
Johnson, S. G. [4 ]
Chan, H. B. [2 ]
机构
[1] Univ Florida, Dept Phys, Gainesville, FL 32611 USA
[2] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China
[3] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA
[4] MIT, Dept Math, Cambridge, MA 02139 USA
[5] MIT, Elect Res Lab, Cambridge, MA 02139 USA
[6] MIT, Dept Phys, Cambridge, MA 02139 USA
[7] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37830 USA
来源
NATURE COMMUNICATIONS | 2013年 / 4卷
关键词
MU-M; ACTUATION; SYSTEMS; RANGE;
D O I
10.1038/ncomms2842
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Quantum fluctuations give rise to van der Waals and Casimir forces that dominate the interaction between electrically neutral objects at sub-micron separations. Under the trend of miniaturization, such quantum electrodynamical effects are expected to play an important role in micro- and nano-mechanical devices. Nevertheless, utilization of Casimir forces on the chip level remains a major challenge because all experiments so far require an external object to be manually positioned close to the mechanical element. Here by integrating a force-sensing micromechanical beam and an electrostatic actuator on a single chip, we demonstrate the Casimir effect between two micromachined silicon components on the same substrate. A high degree of parallelism between the two near-planar interacting surfaces can be achieved because they are defined in a single lithographic step. Apart from providing a compact platform for Casimir force measurements, this scheme also opens the possibility of tailoring the Casimir force using lithographically defined components of non-conventional shapes.
引用
收藏
页数:6
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