Dynamic simulation of atomic force microscope cantilevers oscillating in liquid

被引:19
|
作者
Martin, Michael James [1 ]
Fathy, Hosam K. [2 ]
Houston, Brian H. [1 ]
机构
[1] USN, Res Lab, Washington, DC 20375 USA
[2] Univ Michigan, Dept Mech Engn, Ann Arbor, MI 48109 USA
关键词
D O I
10.1063/1.2970154
中图分类号
O59 [应用物理学];
学科分类号
摘要
To simulate the behavior of an atomic force microscope (AFM) operating in liquid, a lumped-parameter model of a 40 X 5 mu m(2) thick silicon cantilever with natural frequencies ranging from 3.0 to 6.0 X 105 rad/s was combined with a transient Navier-Stokes solver. The equations of motion were solved simultaneously with the time-dependent flow field. The simulations successfully capture known characteristics of the AFM in liquid, including large viscous losses, reduced peak resonant frequencies, and frequency-dependent damping. From these simulations, the transfer function G(s) of the system was obtained. While the transfer function shares many of the characteristics of a second-order system at higher frequencies, the frequency-dependent damping means that a second-order model cannot be applied. The viscous damping of the system is investigated in greater depth. A phase difference between the peak velocity and peak damping force is observed. Both the phase difference and the magnitude of the damping are shown to be functions of the excitation frequency. Finally, the damping is shown to be strongly dependent on the liquid viscosity and weakly dependent on the liquid density. (C) 2008 American Institute of Physics.
引用
收藏
页数:8
相关论文
共 50 条
  • [21] Actuation of atomic force microscope cantilevers by acoustic radiation pressure
    Onaran, AG
    Degertekin, FL
    Hadimioglu, B
    Sulchek, T
    Quate, CF
    2001 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2, 2001, : 509 - 512
  • [22] Method to determine the spring constant of atomic force microscope cantilevers
    Gibson, CT
    Johnson, DJ
    Anderson, C
    Abell, C
    Rayment, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (02): : 565 - 567
  • [23] FRICTION EFFECTS IN THE DEFLECTION OF ATOMIC-FORCE MICROSCOPE CANTILEVERS
    WARMACK, RJ
    ZHENG, XY
    THUNDAT, T
    ALLISON, DP
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (02): : 394 - 399
  • [24] Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers
    Frentrup, Hendrik
    Allen, Matthew S.
    NANOTECHNOLOGY, 2011, 22 (29)
  • [25] Improved acoustic excitation of atomic force microscope cantilevers in liquids
    Maali, A
    Hurth, C
    Cohen-Bouhacina, T
    Couturier, G
    Aimé, JP
    APPLIED PHYSICS LETTERS, 2006, 88 (16)
  • [26] Characterization of heated atomic force microscope cantilevers in air and vacuum
    Lee, Jungchul
    Abel, Mark
    Wright, Tanya L.
    Sunden, Erik
    Marchenkov, Alexei
    Graham, Samuel
    King, William P.
    Advances in Electronic Packaging 2005, Pts A-C, 2005, : 1767 - 1772
  • [27] A virtual instrument to standardise the calibration of atomic force microscope cantilevers
    Sader, John E.
    Borgani, Riccardo
    Gibson, Christopher T.
    Haviland, David B.
    Higgins, Michael J.
    Kilpatrick, Jason I.
    Lu, Jianing
    Mulvaney, Paul
    Shearer, Cameron J.
    Slattery, Ashley D.
    Thoren, Per-Anders
    Tran, Jim
    Zhang, Heyou
    Zhang, Hongrui
    Zheng, Tian
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2016, 87 (09):
  • [28] Thermal calibration of heated silicon atomic force microscope cantilevers
    Nelson, Brent A.
    King, William P.
    TRANSDUCERS '07 & EUROSENSORS XXI, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2, 2007,
  • [29] Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire
    Zhang, Guangjie
    Li, Peng
    Wei, Dawei
    Hu, Kui
    Qiu, Xiaohui
    NANOTECHNOLOGY, 2020, 31 (47)
  • [30] NON-LINEAR FREQUENCY RESPONSE OF ATOMIC FORCE MICROSCOPE CANTILEVERS AT THE SOLID-LIQUID INTERFACE
    Kiracofe, Daniel R.
    Raman, Arvind
    PROCEEDINGS OF THE ASME INTERNATIONAL DESIGN ENGINEERING TECHNICAL CONFERENCES AND COMPUTERS AND INFORMATION IN ENGINEERING CONFERENCE, VOL 5, 2012, : 319 - 328