机构:
Wright State Univ, Semicond Res Ctr, Dayton, OH 45435 USA
Wyle Labs Inc, Dayton, OH 45431 USA
USAF, Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAWright State Univ, Semicond Res Ctr, Dayton, OH 45435 USA
Look, D. C.
[1
,2
,3
]
Leedy, K. D.
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机构:
USAF, Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAWright State Univ, Semicond Res Ctr, Dayton, OH 45435 USA
Leedy, K. D.
[3
]
机构:
[1] Wright State Univ, Semicond Res Ctr, Dayton, OH 45435 USA
[2] Wyle Labs Inc, Dayton, OH 45431 USA
[3] USAF, Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Plasmonic resonances (kres's) at the telecommunication wavelengths of 1.3 and 1.55 mu m can be accurately produced in ZnO layers grown at 200 degrees C by pulsed laser deposition in pure Ar ambient using a ZnO target with 3 wt. % Ga2O3, and then annealed in air to produce Hall-effect-determined carrier concentrations 8.8 and 6.0 x 10(20) cm(-3), respectively. Appropriate values of concentration and Hall mobility for a desired lambda(res) can be conveniently determined from a "plasmonic resonance phase diagram," generated from the Drude equation and mobility theory. Values of lambda(res) as low as 1 mu m can be attained in ZnO. (C) 2013 AIP Publishing LLC.