Study for realization of spin-polarized field effect transistor in In0.75Ga0.25As/In0.75Al0.25As heterostructure

被引:24
|
作者
Sato, Y
Gozu, S
Kita, T
Yamada, S
机构
[1] Japan Adv Inst Sci & Technol, Hokuriku Sch Mat Sci, Ctr New Mat, Ishikawa 9231292, Japan
[2] CREST, Japan Sci & Technol, Kawaguchi, Saitama 3320012, Japan
来源
关键词
narrow gap semiconductor; spin-orbit interaction; spin-polarized electron;
D O I
10.1016/S1386-9477(01)00310-1
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
For realization of the spin-polarized field effect transistor (spin-FET), we investigated a gated modulation of spin-orbit interaction and a spin-injection from a ferromagnetic metal (FM) to a two-dimensional electron gas (2DEG). Prepared samples were an In0.75GaO0.25As/In0.75Al0.25As modulation-doped narrow-gap heterojunction grown by molecular beam epitaxy (MBE). For the determination of spin-orbit interaction parameter, alpha we measured Shubnikov-de Haas (SdH) oscillations at 1.5 K. We confirmed a modulation of D when a gate voltage was applied. We also carried out spin-injection experiments using a multi-terminal geometry sample, which had two different widths Ni40Fe60 electrodes. We observed a spin-valve like effect in a source-drain resistance of similar to 0.1% as well as a resistance hysteresis behavior of similar to 12% in non-local geometry below 20 K. These results are the first step to realize an active spintronic device, such as spin-FET. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:399 / 402
页数:4
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