Intelligent Bipolar Control of MEMS Capacitive Switches

被引:11
|
作者
Ding, Guanghai [1 ]
Molinero, David [1 ]
Wang, Weike [1 ]
Palego, Cristiano [1 ]
Halder, Subrata [1 ]
Hwang, James C. M. [1 ]
Goldsmith, Charles L. [2 ]
机构
[1] Lehigh Univ, Bethlehem, PA 18015 USA
[2] MEMtronics Corp, Plano, TX 75075 USA
关键词
Capacitance measurement; capacitance-voltage characteristics; closed-loop systems; intelligent control; RF microelectromechanical systems (MEMS); VOLTAGE;
D O I
10.1109/TMTT.2012.2227782
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Closed-loop control of microelectromechanical systems (MEMS) capacitive switches was demonstrated by using an intelligent CMOS circuit. The control was based on fine tuning the bias magnitude of the switches according to the difference between sensed and targeted capacitances. Innovative designs were used to allow the CMOS circuit to sense low capacitance and to handle high voltage. The CMOS die of 3 x 1.5 mm(2) was dominated by input/output and voltage regulation/protection circuits; the actual capacitance sense/control circuit was smaller than 0.1 mm(2). The entire circuit consumed 0.7 mW of power during active sense/control, which could be significantly reduced with less frequent sense/control and advanced CMOS technology. With a maximum actuation voltage of +/-40 V and a target capacitance of 0.5 pF, a control accuracy of +/-2.5% was demonstrated, which could be improved to +/-1% with reduced parasitics through monolithic integration. Intelligence was programmed to alternate the bias sign when its magnitude required to maintain the targeted capacitance drifted significantly due to charging of the switch dielectric. Such intelligent control could also be used to compensate for process variation, material creep, ambient temperature change, and RF power loading, which would make MEMS capacitive switches not only more reliable, but also more robust.
引用
收藏
页码:464 / 471
页数:8
相关论文
共 50 条
  • [41] Simulations of Impulsive Dynamics in RF MEMS Capacitive Switches
    Venkattraman, Ayyaswamy
    Alexeenko, Alina
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION, 2011, VOL 11, 2012, : 153 - 158
  • [42] Charging in Dielectricless Capacitive RF-MEMS Switches
    Mardivirin, David
    Pothier, Arnaud
    Crunteanu, Aurelian
    Vialle, Bastien
    Blondy, Pierre
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2009, 57 (01) : 231 - 236
  • [43] Using MEMS capacitive switches in tunable RF amplifiers
    Danson, John
    Plett, Calvin
    Tait, Niall
    EURASIP JOURNAL ON WIRELESS COMMUNICATIONS AND NETWORKING, 2006, 2006 (1)
  • [44] Gamma radiation effects on RF MEMS capacitive switches
    Crunteanu, A.
    Pothier, A.
    Blondy, P.
    Dumas-Bouchiat, F.
    Champeaux, C.
    Catherinot, A.
    Tristant, P.
    Vendier, O.
    Drevon, C.
    Cazaux, J. L.
    Marchand, L.
    MICROELECTRONICS RELIABILITY, 2006, 46 (9-11) : 1741 - 1746
  • [45] Identifying degradation mechanisms in RF MEMS capacitive switches
    Herfst, R. W.
    Steeneken, P. G.
    Schmitz, J.
    MEMS 2008: 21ST IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 2008, : 168 - +
  • [46] Understanding and improving longevity in RF MEMS capacitive switches
    Goldsmith, Chuck
    Forehand, David
    Scarbrough, Derek
    Peng, Zheng
    Palego, Cris
    Hwang, James
    Clevenger, Jason
    RELIABILITY, PACKAGING, TESTING, AND CHARACTERIZATION OF MEMS/MOEMS VII, 2008, 6884
  • [47] Temperature variation of actuation voltage in capacitive MEMS switches
    Goldsmith, CL
    Forehand, DI
    IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2005, 15 (10) : 718 - 720
  • [48] Mechanical modelling of capacitive RF MEMS shunt switches
    Romolo Marcelli
    Andrea Lucibello
    Giorgio De Angelis
    Emanuela Proietti
    Daniele Comastri
    Microsystem Technologies, 2010, 16 : 1057 - 1064
  • [49] The static behavior of RF MEMS capacitive switches in contact
    Suy, H. M. R.
    Herfst, R. W.
    Steeneken, P. C.
    Stulemeijer, J.
    Bielen, J. A.
    NSTI NANOTECH 2008, VOL 3, TECHNICAL PROCEEDINGS: MICROSYSTEMS, PHOTONICS, SENSORS, FLUIDICS, MODELING, AND SIMULATION, 2008, : 517 - +
  • [50] Properties of contactless and contacted charging in MEMS capacitive switches
    Koutsoureli, M.
    Michalas, L.
    Martins, P.
    Papandreou, E.
    Leuliet, A.
    Bansropun, S.
    Papaioannou, G.
    Ziaei, A.
    MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) : 1655 - 1658