Time-Domain Far-Field Measurements for Cross-Correlation Analysis

被引：0
|
作者：
Kuznetsov, Y. [1 ]
Baev, A. [1 ]
Haider, M. [2 ]
Russer, J. A. [2 ]
Russer, P. [2 ]
机构：
[1] Moscow Inst Aviat Technol, Theoret Radio Engn Dept, Moscow, Russia
[2] Tech Univ Munich, Inst Nanoelect, Munich, Germany
来源：
2017 INTERNATIONAL CONFERENCE ON ELECTROMAGNETICS IN ADVANCED APPLICATIONS (ICEAA) | 2017年
基金：
俄罗斯基础研究基金会;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this work the scanned contribution of a pseudo random noise signal generated in a printed circuit board (PCB) is correlated with the radiated electromagnetic interference (EMI) in the near-field as well as in the far-field. Far-field measurements were performed inside the anechoic chamber for the DUT installed on a rotating table. The proposed cross-correlation spatial-time analysis allows to localize the path of the generated pseudorandom source over the PCB surface and to predict the angular distribution of the radiated emissions from the electronic devices.
引用
收藏
页码：1517 / 1520
页数：4
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