K+-ISFET type microsensors fabricated by ion implantation

被引:11
|
作者
Baccar, ZM [1 ]
JaffrezicRenault, N [1 ]
Martelet, C [1 ]
Jaffrezic, H [1 ]
Marest, G [1 ]
Plantier, A [1 ]
机构
[1] UNIV LYON 1,IPNL,GRP TRAITEMENT SURFACES,F-69622 VILLEURBANNE,FRANCE
关键词
K+-ISFET; ion implantation; sensitivity; selectivity; electrochemical sensors;
D O I
10.1016/S0254-0584(97)80077-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The possibility of obtaining K+-ISFET microsensors produced by a mild ion implantation technique is investigated. The selective membrane is obtained by low energy implantation of K+ and Al+ ions directly into the thin silica insulator (100 nm) of the microsensor. The K+-sensitivity, selectivity, drift, reproducibility, and the life time are studied. The sensitivity of the implanted ISEFET equal to 41-44 mV pK(-1) is still stable after a whole year's tests.
引用
收藏
页码:56 / 59
页数:4
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