Al-M (M = Cr, Fe, Mn, Ni) thin-film negative electrode materials

被引:41
|
作者
Fleischauer, MD [1 ]
Obrovac, MN
McGraw, JD
Dunlap, RA
Topple, JM
Dahn, JR
机构
[1] Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada
[2] 3M Co, Elect & Inorgan Technol Ctr, St Paul, MN 55144 USA
[3] Dalhousie Univ, Mat Res Inst, Halifax, NS B3H 3J5, Canada
[4] Queens Univ, Dept Engn Phys, Kingston, ON K7L 3N6, Canada
[5] Dalhousie Univ, Dept Chem, Halifax, NS B3H 3J5, Canada
关键词
D O I
10.1149/1.2161569
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Comprehensive investigations of thin-film Al-M (M = Cr, Fe, Mn, Ni) negative electrode material libraries were performed using combinatorial and high-throughput techniques. Mossbauer effect spectroscopy and X-ray diffraction were used to characterize library structure. The electrochemical performance of over 200 compositions of AlxM1-x (0.75 < x < 1) was determined at both room and elevated temperature. All AlxM1-x alloys are completely inactive above 15 atom % M. Thermodynamic calculations based on the macroscopic atom model of de Boer et al. predict compositions with at least 33-65 atom % M to be inactive. A phenomenological model to describe the observed capacity as a function of transition metal content and cycling temperature is presented. (c) 2006 The Electrochemical Society.
引用
收藏
页码:A484 / A491
页数:8
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