Stitching interferometers: Direct imaging aids asphere metrology

被引：0
|
作者：
Bond, Chris [1 ]
机构：
[1] QED Technol, Rochester, NY 14607 USA
来源：
LASER FOCUS WORLD | 2013年 / 49卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
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页码：107 / 109
页数：3
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