Stitching interferometers: Direct imaging aids asphere metrology

被引：0
|
作者：
Bond, Chris [1 ]
机构：
[1] QED Technol, Rochester, NY 14607 USA
来源：
LASER FOCUS WORLD | 2013年 / 49卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：107 / 109
页数：3
相关论文
共 50 条
  • [11] Advancements in non-contact metrology of asphere and diffractive optics
    DeFisher, Scott
    OPTIFAB 2017, 2017, 10448
  • [12] Ultimate measurement speed for flexible asphere and freeform metrology: TWISS
    Schober, Christian
    Pruss, Christof
    Herkommer, Alois
    Reichelt, Stephan
    OPTICAL INSTRUMENT SCIENCE, TECHNOLOGY, AND APPLICATIONS III, 2024, 13024
  • [13] Electronic imaging using a logarithmic asphere
    Chi, WL
    George, N
    OPTICS LETTERS, 2001, 26 (12) : 875 - 877
  • [14] LASER INTERFEROMETERS IN METROLOGY OF LARGE LENGTHS
    DUBROV, MN
    PRILEPIN, MT
    ALESHIN, VA
    MEASUREMENT TECHNIQUES USSR, 1990, 33 (05): : 445 - 446
  • [15] Absolute distance metrology for space interferometers
    Swinkels, BL
    Bhattacharya, N
    Wielders, AA
    Braat, JJM
    Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 : 312 - 317
  • [16] Absolote distance metrology for space interferometers
    Swinkels, BL
    Wendrich, TJ
    Bhattacharya, N
    Wielders, AA
    Braat, JJM
    ASTRONOMICAL STRUCTURES AND MECHANISMS TECHNOLOGY, 2004, 5495 : 314 - 318
  • [17] Absolute distance metrology for space interferometers
    Swinkels, BL
    Wendrich, TJ
    Bhattacharya, N
    Wielders, AA
    Braat, JJM
    PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON SPACE OPTICS (ICSO 2004), 2004, 554 : 559 - 561
  • [18] Comparison of contact and non-contact asphere surface metrology devices
    DeFisher, Scott
    Fess, Edward M.
    OPTIFAB 2013, 2013, 8884
  • [19] Stitching Interferometry: A Flexible Solution for Surface Metrology
    Murphy, Paul
    Forbes, Greg
    Fleig, Jon
    Dumas, Paul
    Tricard, Marc
    Optics and Photonics News, 2003, 14 (05): : 38 - 43
  • [20] Study on stitching interferometry for synchrotron mirror metrology
    Huang L.
    Wang T.
    Idir M.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2020, 49 (03):
12345