Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

被引：2

作者：

Duarte, S., Jr. ^{[1
]}

Avishai, A. ^{[2
]}

Sadan, A. ^{[1
]}

机构：

[1] Case Western Reserve Univ, Dept Comprehens Care, Cleveland, OH 44106 USA

[2] Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA

来源：

MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷

关键词：

D O I：

10.1017/S1431927609098031

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：368 / 369

页数：2

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