共 50 条
- [1] Atomic force microscopy imaging of fragments from the martian meteorite ALH84001 J. Microsc., 1 (2-6):
- [2] Atomic force microscopy imaging of fragments from the Martian meteorite ALH84001 JOURNAL OF MICROSCOPY-OXFORD, 1998, 189 : 2 - 7
- [4] Focused ion beam specimen preparation for transmission electron microscopy studies of ULSI devices MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, 1999, (164): : 593 - 602
- [5] Proposals for exact point transmission electron microscopy using focused ion beam specimen preparation technique JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 2532 - 2537
- [6] Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling JOURNAL OF ELECTRON MICROSCOPY, 2004, 53 (05): : 497 - 500
- [8] Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2014, (89):