Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

被引：2
|
作者：
Duarte, S., Jr. [1 ]
Avishai, A. [2 ]
Sadan, A. [1 ]
机构：
[1] Case Western Reserve Univ, Dept Comprehens Care, Cleveland, OH 44106 USA
[2] Case Western Reserve Univ, Dept Mat Sci & Engn, Cleveland, OH 44106 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609098031
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：368 / 369
页数：2
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