Characterization of the surface properties of commercially available dental implants using scanning electron microscopy, focused ion beam, and high-resolution transmission electron microscopy

被引:64
|
作者
Jarmar, Tobias [1 ]
Palmquist, Anders [2 ]
Branemark, Rickard [3 ]
Hermansson, Leif [1 ]
Engqvist, Hakan [1 ]
Thomsen, Peter [2 ]
机构
[1] Uppsala Univ, Dept Engn Sci, SE-75121 Uppsala, Sweden
[2] Univ Gothenburg, Sahlgrenska Acad, Dept Biomat, SE-40530 Gothenburg, Sweden
[3] Univ Gothenburg, Sahlgrenska Univ Hosp, Dept Orthopaed, SE-41345 Gothenburg, Sweden
关键词
dental implants; FIB; osseointegration; profilometry; SEM; surface morphology; TEM; titanium; ultrastructure;
D O I
10.1111/j.1708-8208.2007.00056.x
中图分类号
R78 [口腔科学];
学科分类号
1003 ;
摘要
Background: Since osseointegration of the respective implant is claimed by all manufacturing companies, it is obvious that not just one specific surface profile including the chemistry controls bone apposition. Purpose: The purpose was to identify and separate out a particular set of surface features of the implant surfaces that can contribute as factors in the osseointegration process. Material and Methods: The surface properties of several commercially available dental implants were extensively studied using profilometry, scanning electron microscopy, and transmission electron microscopy. Ultrathin sections prepared with focused ion beam microscopy (FIB) provided microstructural and chemical data which have not previously been communicated. The implants were the Nobel Biocare TiUnite (R) (Nobel Biocare AB, Goteborg, Sweden), Nobel Biocare Steri-Oss HA-coated (Nobel Biocare AB, Yorba Linda, CA, USA), Astra-Tech OsseoSpeed (TM) (Astra Tech AB, Molndal, Sweden), Straumann SLA (R) (Straumann AG, Waldenburg, Switzerland), and the Branemark Integration Original Fixture implant (Branemark Integration, Goteborg, Sweden). Results: It was found that their surface properties had differences. The surfaces were covered with crystalline TiO2 (both anatase and rutile), amorphous titanium oxide, phosphorus doped amorphous titanium oxide, fluorine, titanium hydride, and hydroxyapatite, respectively. Conclusion: This indicates that the provision of osseointegration is not exclusively linked to a particular set of surface features if the implant surface character is a major factor in that process. The studied methodology provides an effective tool to also analyze the interface between implant and surrounding bone. This would be a natural next step in understanding the ultrastructure of the interface between bone and implants.
引用
收藏
页码:11 / 22
页数:12
相关论文
共 50 条
  • [1] Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy
    Duarte, S., Jr.
    Avishai, A.
    Sadan, A.
    [J]. MICROSCOPY AND MICROANALYSIS, 2009, 15 : 368 - 369
  • [2] Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling
    Sasaki, H
    Matsuda, T
    Kato, T
    Muroga, T
    Iijima, Y
    Saitoh, T
    Iwase, F
    Yamada, Y
    Izumi, T
    Shiohara, Y
    Hirayama, T
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 2004, 53 (05): : 497 - 500
  • [3] Surface characterization analysis of failed dental implants using scanning electron microscopy
    Daood, Umer
    Bandey, Ninette
    Bin Qasim, Saad
    Omar, Hanan
    Khan, Saad A.
    [J]. ACTA ODONTOLOGICA SCANDINAVICA, 2011, 69 (06) : 367 - 373
  • [4] Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross sections dor high resolution electron microscopy
    Langford, RM
    Petford-Long, AK
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (03): : 982 - 985
  • [5] High-Resolution 3D Reconstruction of Human Oocytes Using Focused Ion Beam Scanning Electron Microscopy
    Trebichalska, Zuzana
    Javurek, Jakub
    Tatickova, Martina
    Kyjovska, Drahomira
    Kloudova, Sona
    Otevrel, Pavel
    Hampl, Ales
    Holubcova, Zuzana
    [J]. FRONTIERS IN CELL AND DEVELOPMENTAL BIOLOGY, 2021, 9
  • [6] Atomistic electron beam processing in high-resolution transmission electron microscopy
    Kizuka, T
    Tanaka, N
    Yanaka, T
    [J]. ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, : 537 - 538
  • [7] Applications of scanning electron microscopy and focused ion beam milling in dental research
    House, Krystal L.
    Pan, Long
    O'Carroll, Deirdre M.
    Xu, Shiyou
    [J]. EUROPEAN JOURNAL OF ORAL SCIENCES, 2022, 130 (02)
  • [8] Revisiting focused ion beam scanning electron microscopy
    Marshall, Andrea G.
    Damo, Steven M.
    Hinton, Antentor, Jr.
    [J]. TRENDS IN BIOCHEMICAL SCIENCES, 2023, 48 (06) : 585 - 586
  • [9] Focused ion beam scanning electron microscopy in biology
    Kizilyaprak, C.
    Daraspe, J.
    Humbel, B. M.
    [J]. JOURNAL OF MICROSCOPY, 2014, 254 (03) : 109 - 114
  • [10] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
    LIU, J
    COWLEY, JM
    [J]. ULTRAMICROSCOPY, 1993, 52 (3-4) : 335 - 346