Refurbishment of an Au-coated toroidal mirror by capacitively coupled RF plasma discharge

被引:10
|
作者
Yadav, Praveen Kumar [1 ,2 ]
Kumar, Mukund [3 ]
Gupta, Raj Kumar [1 ]
Sinha, Mangalika [2 ]
Chakera, J. A. [3 ]
Modi, M. H. [1 ,2 ]
机构
[1] Raja Ramanna Ctr Adv Technol, Soft Xray Applicat Lab, Indore 452013, Madhya Pradesh, India
[2] Homi Bhabha Natl Inst, Mumbai 400094, Maharashtra, India
[3] Raja Ramanna Ctr Adv Technol, Laser Plasma Sect, Indore 452013, Madhya Pradesh, India
关键词
synchrotron optics; carbon contamination; RF plasma; soft X-ray reflectivity; INDUCED CARBON CONTAMINATION; EFFICIENCY RECOVERY; OXYGEN; GRATINGS; SURFACE; RESUSCITATION; REFLECTION;
D O I
10.1107/S1600577519003485
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Deposition of synchrotron-radiation-induced carbon contamination on beamline optics causes their performance to deteriorate, especially near the carbon K edge. The photon flux losses due to carbon contamination have spurred researchers to search for a suitable decontamination technique to restore the optical surface and retain its performance. Several in situ and ex situ refurbishing strategies for beamline optics are still under development to solve this serious issue. In this work, the carbon contamination is removed from a large (340mm x 60mm) Au-coated toroidal mirror surface using a capacitively coupled low-pressure RF plasma. Before and after RF plasma cleaning, the mirror was characterized by Raman spectroscopy, soft X-ray reflectivity (SXR) and atomic force microscopy (AFM) techniques. The Raman spectra of the contaminated mirror clearly show the G (1575-1590cm(-1)) and D (1362-1380cm(-1)) bands of graphitic carbon. The SXR curve of the contaminated mirror shows a clear dip near the critical momentum transfer of carbon, indicating the presence of carbon contamination on the mirror surface. This dip disappears after removal of the contamination layer by RF plasma exposure. A decrease in the intensities of the CO bands is also observed by optical emission spectrometry during plasma exposure. The AFM and SXR results suggest that the root-mean-square (r.m.s.) roughness of the mirror surface does not increase after plasma exposure.
引用
收藏
页码:1152 / 1160
页数:9
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