3D Monolithic Integrated Thermoelectric IR Sensor

被引:0
|
作者
Xu, Dehui [1 ]
Xiong, Bin [1 ]
Wu, Guoqiang [1 ]
Ma, Yinglei [1 ]
Jing, Errong [1 ]
Wang, Yueling [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Beijing 100864, Peoples R China
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we demonstrate a 3D monolithic integrated thermoelectric IR sensor by using CMOS-MEMS technology. Since CMOS technology is a plane process, wafer-level packaging is used to further improve the system integration density. Both the circuit interface and IR filter are integrated in the thermoelectric IR sensor. In the vertical direction, IR filter is integrated with IR sensor to miniaturize the IR system by wafer-level Au-Si bonding, as well as improve sensor performance by the vacuum bonding. In the plane direction, the thermopile microstructure was fabricated by standard CMOS process and released by XeF2 Post-CMOS technology. Thus, the sensor merges benefits of CMOS technology with the advantage of on chip signal processing.
引用
收藏
页码:480 / 483
页数:4
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