Monolithic 3D integrated circuits

被引:0
|
作者
Wong, Simon [1 ]
El-Gamal, Abbas [1 ]
Griffin, Peter [1 ]
Nishi, Yoshio [1 ]
Pease, Fabian [1 ]
Plummer, James [1 ]
机构
[1] Stanford Univ, Elect Engn, Stanford, CA 94305 USA
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
3D IC's promise to solve the 2D communication bottleneck, and enable the integration of heterogeneous materials, devices and systems. There are at least three approaches to realize 3D IC's : chip stacking, wafer stacking and full monolithic integration. Each approach is at a different level of maturity and offers various degree of improvement. This paper will focus on the monolithic 3D approach, which offers a high density of device-dimension vertical interconnects and thereby facilitates the optimal assembly of transistors and interconnects in a 3D volume. The performance advantages of such a technology are demonstrated with a 3D-FPGA. Technology challenges of monolithic approach are discussed.
引用
收藏
页码:66 / +
页数:2
相关论文
共 50 条
  • [1] Cost Model for Monolithic 3D Integrated Circuits
    Gitlin, Daniel
    Vinet, Maud
    Clermidy, Fabien
    [J]. 2016 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S), 2016,
  • [2] Pairing ILVs for Testing Monolithic 3D Integrated Circuits
    Gupta, Vivek Kumar
    Roy, Surajit Kumar
    Giri, Chandan
    [J]. 2018 INTERNATIONAL SYMPOSIUM ON DEVICES, CIRCUITS AND SYSTEMS (ISDCS), 2018,
  • [3] Monolithic 3D Integrated Circuits: Recent Trends and Future Prospects
    Dhananjay, Krithika
    Shukla, Prachi
    Pavlidis, Vasilis F.
    Coskun, Ayse
    Salman, Emre
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2021, 68 (03) : 837 - 843
  • [4] A Design-for-Test Solution for Monolithic 3D Integrated Circuits
    Wang, Ran
    Chakrabarty, Krishnendu
    [J]. 2016 21TH IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2016,
  • [5] A Design-for-Test Solution for Monolithic 3D Integrated Circuits
    Koneru, Abhishek
    Kannan, Sukeshwar
    Chakrabarty, Krishnendu
    [J]. 2017 IEEE 35TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD), 2017, : 685 - 688
  • [6] 3DCoB: A new design approach for Monolithic 3D Integrated Circuits
    Sarhan, Hossam
    Thuries, Sebastien
    Billoint, Olivier
    Clermidy, Fabien
    [J]. 2014 19TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC), 2014, : 79 - 84
  • [7] Impact of Wafer-Bonding Defects on Monolithic 3D Integrated Circuits
    Koneru, Abhishek
    Kannan, Sukeshwar
    Chakrabarty, Krishnendu
    [J]. 2016 IEEE 25TH CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS (EPEPS), 2016, : 91 - 93
  • [8] Cell Transformations and Physical Design Techniques for 3D Monolithic Integrated Circuits
    Bobba, Shashikanth
    Chakraborty, Ashutosh
    Thomas, Olivier
    Batude, Perrine
    De Micheli, Giovanni
    [J]. ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2013, 9 (03)
  • [9] Thermal Accumulation Improvement for Fabrication Manufacturing of Monolithic 3D Integrated Circuits
    Liu, Y. -T.
    Lee, M. H.
    Chen, H. T.
    Huang, C. -F.
    Peng, C-Y.
    Lee, L. -S.
    Kao, M. -J.
    [J]. 2008 9TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1-4, 2008, : 1199 - +
  • [10] Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits
    Koneru, Abhishek
    Chakrabarty, Krishnendu
    [J]. GLSVLSI '19 - PROCEEDINGS OF THE 2019 ON GREAT LAKES SYMPOSIUM ON VLSI, 2019, : 457 - 462