Temperature controlled microstage for an atomic force microscope

被引：41
|
作者：
Musevic, I
Slak, G
Blinc, R
机构：
[1] J. Stefan Institute, 61 000 Ljubljana
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1996年 / 67卷 / 07期
关键词：
D O I：
10.1063/1.1147212
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A temperature controlled microstage has been developed for an atomic force microscope (AFM). The stage is based on a small, temperature regulated heater, which is attached to the piezo-scanner of the AFM. The operating performances of the AFM have been tested in air at elevated temperatures. It was found that atomic resolution can routinely be achieved up to 80 degrees C, whereas beyond this temperature, the onset of thermal instabilities of the AFM cantilever was observed. (C) 1996 American Institute of Physics.
引用
收藏
页码：2554 / 2556
页数：3
相关论文
共 50 条
  • [1] Force spectroscopy based on temperature controlled atomic force microscope head using piezoresistive cantilevers
    Musevic, I
    Kocevar, K
    Krzic, U
    Carbone, G
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (04):
  • [2] Fabrication of polymer cantilevers for force controlled atomic force microscope
    Nobuhiro, KA
    Choong, SP
    Matsumoto, T
    Kikuta, H
    Iwata, K
    LITHOGRAPHIC AND MICROMACHINING TECHNIQUES FOR OPTICAL COMPONENT FABRICATION II, 2003, 5183 : 71 - 78
  • [3] Pitch calibration by an active temperature controlled traceable atomic force microscope and a laser diffractometer
    Chen, CJ
    Pan, SP
    Chang, LC
    MEASUREMENT TECHNOLOGY AND INTELLIGENT INSTRUMENTS VI, 2005, 295-296 : 89 - 94
  • [4] WiFi-controlled portable atomic force microscope
    Wang, Yingda
    You, Qingyang
    Zhang, Ziyao
    Chen, Jiajun
    Zhang, Haijun
    MICROSCOPY RESEARCH AND TECHNIQUE, 2019, 82 (09) : 1455 - 1460
  • [5] CONTROLLED MANIPULATION OF NANOPARTICLES WITH AN ATOMIC-FORCE MICROSCOPE
    JUNNO, T
    DEPPERT, K
    MONTELIUS, L
    SAMUELSON, L
    APPLIED PHYSICS LETTERS, 1995, 66 (26) : 3627 - 3629
  • [6] Switchable Silver Nanostructures Controlled with an Atomic Force Microscope
    Bakhti, S.
    Biswas, S.
    Hubert, C.
    Reynaud, S.
    Vocanson, F.
    Destouches, N.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2014, 118 (14): : 7494 - 7500
  • [7] A new force controlled atomic force microscope for use in ultrahigh vacuum
    Jarvis, SP
    Yamada, H
    Yamamoto, SI
    Tokumoto, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (06): : 2281 - 2285
  • [8] Cantilever temperature characterization in low temperature vacuum atomic force microscope
    Kazantsev, DV
    Dal Savio, C
    Danzebrink, HU
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (04):
  • [9] Atomic force microscope
    不详
    MICRO, 1995, 13 (10): : 22 - 22
  • [10] THE ATOMIC FORCE MICROSCOPE
    GOH, MC
    MARKIEWICZ, P
    CHEMISTRY & INDUSTRY, 1992, (18) : 687 - 691
12345