Scanning-tunneling/atomic-force microscopy study of the growth of KBr films on InSb(001)

被引:18
|
作者
Kolodziej, JJ
Such, B
Czuba, P
Krok, F
Piatkowski, P
Szymonski, M
机构
[1] Jagiellonian Univ, Inst Phys, PL-30059 Krakow, Poland
[2] Jagiellonian Univ, Reg Lab Physicochem Anal & Struct Res, PL-30060 Krakow, Poland
关键词
alkali halides; indium antimonide; scanning tunneling microscopy; atomic force microscopy; growth;
D O I
10.1016/S0039-6028(02)01438-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Thin epitaxial films of KBr have been grown on InSb(011) substrate, Scanning tunneling microscopy and noncontact atomic-force microscopy in ultra-high vacuum have been used to study the film surfaces for coverages ranging from 0.3 to 120 ML. It has been found that initially islands of monatomic thickness are formed. These islands are often cut along (110) crystallographic direction and the distribution of these islands on the substrate Surface is anisotropic which reflects the anisotropic diffusion of KBr molecules during growth. At 1 1.5 ML coverage a wetting single-atomic KBr film is formed and the deposited material in excess of I ML forms rectangular islands with edges oriented along (100) and (010) crystallographic directions. The KBr/InSb interface is likely stabilized by a bond between the halide ion and All, atoms arranged in chains on c(8 x 2) InSb. For high (multilayer.) KBr coverages the growth is basically a layer-by-layer type but. due to slow diffusion of KBr molecules down across steps. the (n + 1)th layer starts to grow before the completion of nth layer. In result, pyramidal structures of rectangular bases are formed on the surface. These rough films can be. with thermal annealing. converted to flat films exposing large (001) terraces. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:12 / 22
页数:11
相关论文
共 50 条
  • [31] SCANNING PROBE MICROSCOPY (TUNNELING, ATOMIC-FORCE, CONFOCAL AND ACOUSTIC) IN PARTICLE TRACK DETECTORS
    VUKOVIC, JB
    ANTANASIJEVIC, R
    RADIATION MEASUREMENTS, 1995, 25 (1-4) : 745 - 748
  • [32] Interlayer diffusion of adatoms: A scanning-tunneling microscopy study
    Lundgren, E
    Stanka, B
    Leonardelli, G
    Schmid, M
    Varga, P
    PHYSICAL REVIEW LETTERS, 1999, 82 (25) : 5068 - 5071
  • [33] Imaging of vortex configurations in thin films by scanning-tunneling microscopy
    van Baarle, GJC
    Troianovski, AM
    Nishizaki, T
    Kes, PH
    Aarts, J
    APPLIED PHYSICS LETTERS, 2003, 82 (07) : 1081 - 1083
  • [34] SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY STUDIES OF BIOMATERIALS AT A LIQUID-SOLID INTERFACE
    LINDSAY, SM
    LYUBCHENKO, YL
    TAO, NJ
    LI, YQ
    ODEN, PI
    DEROSE, JA
    PAN, J
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1993, 11 (04): : 808 - 815
  • [35] ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY OBSERVATIONS ON SI(111) IN SEVERAL SOLUTIONS
    ANDO, A
    MIKI, K
    SHIMIZU, T
    MATSUMOTO, K
    MORITA, Y
    TOKUMOTO, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (2B): : 715 - 718
  • [36] ATOMIC-FORCE MICROSCOPY STUDY OF THE MICROROUGHNESS OF SIC THIN FILMS
    BLOUIN, M
    GUAY, D
    ELKHAKANI, MA
    CHAKER, M
    BOILY, S
    JEAN, A
    THIN SOLID FILMS, 1994, 249 (01) : 38 - 43
  • [37] PREDICTION OF THE BIDIRECTIONAL REFLECTANCE-DISTRIBUTION FUNCTION FROM ATOMIC-FORCE AND SCANNING-TUNNELING MICROSCOPE MEASUREMENTS OF INTERFACIAL ROUGHNESS
    BRUNO, WM
    ROTH, JA
    BURKE, PE
    HEWITT, WB
    HOLMBECK, RE
    NEAL, DG
    APPLIED OPTICS, 1995, 34 (07): : 1229 - 1238
  • [38] Morphology and conductivity of PEDOT/PSS films studied by scanning-tunneling microscopy
    Timpanaro, S
    Kemerink, M
    Touwslager, FJ
    De Kok, MM
    Schrader, S
    CHEMICAL PHYSICS LETTERS, 2004, 394 (4-6) : 339 - 343
  • [39] SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY FOR MICROTRIBOLOGY
    KANEKO, R
    NONAKA, K
    YASUDA, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (02): : 291 - 292
  • [40] Investigation of the local density of states in self-assembled GeSi/Si(001) nanoislands by combined scanning tunneling and atomic-force microscopy
    P. A. Borodin
    A. A. Bukharaev
    D. O. Filatov
    M. A. Isakov
    V. G. Shengurov
    V. Yu. Chalkov
    Yu. A. Denisov
    Semiconductors, 2011, 45