An Off-line MDSI Interconnect BIST Incorporated in BS 1149.1

被引：0

作者：

Mohammadi, Marzieh ^{[1
]}

Sadeghi-Kohan, Somayeh ^{[1
]}

Masoumi, Nasser ^{[1
]}

Navabi, Zainalabedin ^{[1
]}

机构：

[1] Univ Tehran, Coll Engn, Sch Elect & Comp Engn, Tehran, Iran

来源：

2014 19TH IEEE EUROPEAN TEST SYMPOSIUM (ETS 2014) | 2014年

关键词：

crosstalk fault; MDSI modeling; IEEE; 1149.1;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an off-line interconnect test methodology that implements the MDSI (Maximal Dominant Signal Integrity) crosstalk fault model. The test methodology consists of MDSI test pattern generators and response analyzers that are incorporated into the IEEE BS 1149.1 Standard on the two sides of an interconnect. This work is the first in implementing MDSI hardware structure. Our method is compared with hardware structures implementing MA interconnect tests.

引用

页数：2

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