GaN for power devices: benefits, applications, and normally-off technologies

被引:0
|
作者
Longobardi, G. [1 ,2 ]
机构
[1] Univ Cambridge, Dept Engn, Cambridge, England
[2] Cambridge GaN Devices Ltd, Cambridge, England
关键词
Gallium Nitride (GaN); normally-off technologies; traps; power devices; reliability; DONOR TRAPS; ALGAN/GAN; MISFET;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Gallium Nitride (GaN) based power devices have been demonstrated to deliver higher energy efficiency than their Silicon (Si) counterparts for 200-1.2kV rated applications. The benefits of GaN technologies and their market potential will be highlighted in this paper together with the main challenges that GaN-based power systems need to overcome to reach their full potential and finally enter the market. These challenges include: (i) normally-off operation, (ii) low threshold voltage (iii) high-voltage reliability, and (iv) unstable switching behaviour. A particular focus will be given to the solutions proposed in literature for obtaining the desired normally-off operation and enhanced stability. Finally, measurement results on one of the aspects related to the reliability of the gate of a commercially available normally-off GaN transistor will be discussed.
引用
收藏
页码:11 / 18
页数:8
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