Deep/shallow levels in arsenic-doped HgCdTe determined by modulated photoluminescence spectra

被引:31
|
作者
Yue, Fangyu [1 ,2 ]
Wu, Jun [3 ]
Chu, Junhao [1 ,2 ]
机构
[1] E China Normal Univ, Minist Educ, Lab Polar Mat & Devices, Shanghai 200241, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[3] Chinese Acad Sci, Shanghai Inst Tech Phys, Res Ctr Adv Mat & Devices, Shanghai 200083, Peoples R China
关键词
D O I
10.1063/1.2983655
中图分类号
O59 [应用物理学];
学科分类号
摘要
The modulated photoluminescence spectra have been performed on as-grown and in situ annealed arsenic-doped Hg(1-x)Cd(x)Te grown by molecular beam epitaxy. Besides the discussions about shallow levels including V(Hg), As(Hg), V(Hg)-As(Hg) complex, and Te(Hg), two deep levels have been observed in as-grown with an ionization energy of similar to 77.0 and similar to 95.0 meV, respectively, which can be completely eliminated by annealing and temporarily ascribed to As-related clusters or interstitials. (C) 2008 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 50 条
  • [1] Photoluminescence and electrical characteristics of arsenic-doped HgCdTe
    Zhang Xiao-Hua
    Chen Lu
    Lin Tie
    He Li
    Guo Shao-Ling
    Chu Jun-Hao
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 2012, 31 (05) : 407 - 410
  • [2] Arsenic-doped HgCdTe: FTIR photoluminescence and photoreflectance spectroscopy study
    Ruzhevich, M. S.
    Mynbaev, K. D.
    Firsov, D. D.
    Chumanov, I. V.
    Komkov, O. S.
    Marin, D. V.
    Varavin, V. S.
    Yakushev, M. V.
    SOLID STATE COMMUNICATIONS, 2024, 394
  • [3] Modulated photoluminescence of shallow levels in arsenic-doped Hg1-xCdxTe (x≈0.3) grown by molecular beam epitaxy
    Yue, Fangyu
    Chu, Junhao
    Wu, Jun
    Hu, Zhigao
    Li, Yawei
    Yang, Pingxiong
    APPLIED PHYSICS LETTERS, 2008, 92 (12)
  • [4] Growth of very low arsenic-doped HgCdTe
    Chandra, D
    Weirauch, DF
    Schaake, HF
    Kinch, MA
    Aqariden, F
    Wan, CF
    Shih, HD
    JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (06) : 963 - 967
  • [5] Growth of very low arsenic-doped HgCdTe
    D. Chandra
    D. F. Weirauch
    H. F. Schaake
    M. A. Kinch
    F. Aqariden
    C. F. Wan
    H. D. Shih
    Journal of Electronic Materials, 2005, 34 : 963 - 967
  • [6] Infrared photoluminescence of arsenic-doped HgCdTe in a wide temperature range of up to 290 K
    Zhang, Xiaohua
    Shao, Jun
    Chen, Lu
    Lue, Xiang
    Guo, Shaoling
    He, Li
    Chu, Junhao
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (04)
  • [7] Sources of carrier compensation in arsenic-doped HgCdTe
    Duan, H.
    Dong, Y. Z.
    Luo, J.
    Huang, Y.
    Chen, X. S.
    Lu, W.
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2013, 74 (01) : 57 - 64
  • [8] Higher Dislocation Density of Arsenic-Doped HgCdTe Material
    Vilela, M. F.
    Olsson, K. R.
    Rybnicek, K.
    Bangs, J. W.
    Jones, K. A.
    Harris, S. F.
    Smith, K. D.
    Lofgreen, D. D.
    JOURNAL OF ELECTRONIC MATERIALS, 2014, 43 (08) : 3018 - 3024
  • [9] Higher Dislocation Density of Arsenic-Doped HgCdTe Material
    M.F. Vilela
    K.R. Olsson
    K. Rybnicek
    J.W. Bangs
    K.A. Jones
    S.F. Harris
    K.D. Smith
    D.D. Lofgreen
    Journal of Electronic Materials, 2014, 43 : 3018 - 3024
  • [10] Arsenic-doped mid-wavelength infrared HgCdTe photodiodes
    Kinch, MA
    Chandra, D
    Schaake, HF
    Shih, HD
    Aqariden, F
    JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (06) : 590 - 595