Recent Progress on Energy-Related Applications of HfO2-Based Ferroelectric and Antiferroelectric Materials

被引:42
|
作者
Ali, Faizan [1 ]
Zhou, Dayu [1 ,2 ]
Ali, Mohsin [1 ]
Ali, Hafiz Waqas [1 ]
Daaim, Muhammad [1 ]
Khan, Sheeraz [1 ]
Hussain, Muhammad Muzammal [1 ]
Sun, Nana [1 ]
机构
[1] Dalian Univ Technol, Key Lab Mat Modificat Laser Ion & Elect Beams, Minist Educ, Sch Mat Sci & Engn, Dalian 116024, Peoples R China
[2] Dalian Univ Technol, Dalian 116024, Peoples R China
来源
ACS APPLIED ELECTRONIC MATERIALS | 2020年 / 2卷 / 08期
基金
中国国家自然科学基金;
关键词
energy storage; pyroelectric effect; solid-state cooling; hafnium oxide; ferroelectric; antiferroelectric; THIN-FILMS; NEGATIVE CAPACITANCE; HAFNIUM OXIDE; PYROELECTRIC PROPERTIES; PHASE-TRANSITIONS; STORAGE; BEHAVIOR; DENSITY; HFO2; DEVICES;
D O I
10.1021/acsaelm.0c00304
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ferroelectric and antiferroelectric materials are promising options for energyrelated (such as energy harvesting, energy storage, IR detection, and refrigeration) and memory applications (such as ferroelectric random-access memory (FeRAM) and ferroelectric field-effect transistor (FeFET)). In the past, several classes of materials (such as polymers, ceramics, single crystals, and glasses) have been studied for these properties. However, because of a large deposition thickness (in micrometers or larger), these materials are inappropriate for future nanoscale devices. Recently, the ferroelectric and antiferroelectric HfO2-based thin films have also been studied for the energy-related and memory applications. HfO2-based materials have many advantages over the conventional materials, such as compatibility with Si-based semiconductor technology, ultrasmall thicknesses (nm), and simple compositions, and they are appropriate for integration within 3-D nanostructures. HfO2-based materials can be promising for energy-related applications, such as energy storage, pyroelectric energy harvesting, IR sensors, and solid-state cooling. This article provides some basic knowledge of these energy-related properties. Moreover, this article reviews the energy-related properties of HfO2-based thin films, their origins, and the prospects of this research field.
引用
收藏
页码:2301 / 2317
页数:17
相关论文
共 50 条
  • [41] On the thickness dependence of the polarization switching kinetics in HfO2-based ferroelectric
    Sawabe, Yoshiki
    Saraya, Takuya
    Hiramoto, Toshiro
    Su, Chun-Jung
    Hu, Vita Pi-Ho
    Kobayashi, Masaharu
    [J]. APPLIED PHYSICS LETTERS, 2022, 121 (08)
  • [42] One Nanometer HfO2-Based Ferroelectric Tunnel Junctions on Silicon
    Cheema, Suraj S.
    Shanker, Nirmaan
    Hsu, Cheng-Hsiang
    Datar, Adhiraj
    Bae, Jongho
    Kwon, Daewoong
    Salahuddin, Sayeef
    [J]. ADVANCED ELECTRONIC MATERIALS, 2022, 8 (06)
  • [43] Si-Doped HfO2-Based Ferroelectric Tunnel Junctions with a Composite Energy Barrier for Non-Volatile Memory Applications
    Lee, Yoseop
    Song, Sungmun
    Ham, Woori
    Ahn, Seung-Eon
    [J]. MATERIALS, 2022, 15 (06)
  • [44] Tailoring mesoporous carbons and related materials for energy-related applications
    Dai, Sheng
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 245
  • [45] Tailoring mesoporous carbon materials for energy-related applications
    Dai, Sheng
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2011, 241
  • [46] Energy-related applications of carbon materials-a review
    Srivastava, Manoj
    Kumar, Manoj
    Singh, Ranvir
    Agrawal, U. C.
    Garg, M. O.
    [J]. JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH, 2009, 68 (02): : 93 - 96
  • [47] High-entropy materials for energy-related applications
    Fu, Maosen
    Ma, Xiao
    Zhao, Kangning
    Li, Xiao
    Su, Dong
    [J]. ISCIENCE, 2021, 24 (03)
  • [48] Nanostructured materials by ATRP for potential energy-related applications
    Matyjaszewski, Krzysztof
    Kowalewski, Tomasz
    Paik, Hong-jong
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2012, 244
  • [49] HfO2-Based Highly Stable Radiation-Immune Ferroelectric Memory
    Huang, Fei
    Wang, Yan
    Liang, Xiao
    Qin, Jun
    Zhang, Yan
    Yuan, Xiufang
    Wang, Zhuo
    Peng, Bo
    Deng, Longjiang
    Liu, Qi
    Bi, Lei
    Liu, Ming
    [J]. IEEE ELECTRON DEVICE LETTERS, 2017, 38 (03) : 330 - 333
  • [50] Non-volatile data storage in HfO2-based ferroelectric FETs
    Schroeder, U.
    Yurchuk, E.
    Mueller, S.
    Mueller, J.
    Slesazeck, S.
    Schloesser, T.
    Trentzsch, M.
    Mikolajick, T.
    [J]. 2012 12TH ANNUAL NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM, 2012, : 60 - 63