Recent Progress on Energy-Related Applications of HfO2-Based Ferroelectric and Antiferroelectric Materials

被引:42
|
作者
Ali, Faizan [1 ]
Zhou, Dayu [1 ,2 ]
Ali, Mohsin [1 ]
Ali, Hafiz Waqas [1 ]
Daaim, Muhammad [1 ]
Khan, Sheeraz [1 ]
Hussain, Muhammad Muzammal [1 ]
Sun, Nana [1 ]
机构
[1] Dalian Univ Technol, Key Lab Mat Modificat Laser Ion & Elect Beams, Minist Educ, Sch Mat Sci & Engn, Dalian 116024, Peoples R China
[2] Dalian Univ Technol, Dalian 116024, Peoples R China
来源
ACS APPLIED ELECTRONIC MATERIALS | 2020年 / 2卷 / 08期
基金
中国国家自然科学基金;
关键词
energy storage; pyroelectric effect; solid-state cooling; hafnium oxide; ferroelectric; antiferroelectric; THIN-FILMS; NEGATIVE CAPACITANCE; HAFNIUM OXIDE; PYROELECTRIC PROPERTIES; PHASE-TRANSITIONS; STORAGE; BEHAVIOR; DENSITY; HFO2; DEVICES;
D O I
10.1021/acsaelm.0c00304
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ferroelectric and antiferroelectric materials are promising options for energyrelated (such as energy harvesting, energy storage, IR detection, and refrigeration) and memory applications (such as ferroelectric random-access memory (FeRAM) and ferroelectric field-effect transistor (FeFET)). In the past, several classes of materials (such as polymers, ceramics, single crystals, and glasses) have been studied for these properties. However, because of a large deposition thickness (in micrometers or larger), these materials are inappropriate for future nanoscale devices. Recently, the ferroelectric and antiferroelectric HfO2-based thin films have also been studied for the energy-related and memory applications. HfO2-based materials have many advantages over the conventional materials, such as compatibility with Si-based semiconductor technology, ultrasmall thicknesses (nm), and simple compositions, and they are appropriate for integration within 3-D nanostructures. HfO2-based materials can be promising for energy-related applications, such as energy storage, pyroelectric energy harvesting, IR sensors, and solid-state cooling. This article provides some basic knowledge of these energy-related properties. Moreover, this article reviews the energy-related properties of HfO2-based thin films, their origins, and the prospects of this research field.
引用
收藏
页码:2301 / 2317
页数:17
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