Optimizing a dual-rotating-retarder Mueller matrix polarimeter

被引:2
|
作者
Smith, MH
机构
关键词
polarimetry; optimization; retardance; condition number;
D O I
10.1117/12.452904
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An optimization of a dual-rotating-retarder Mueller matrix polarimeter is performed by minimizing the condition number of the system data reduction matrix. The optimum retardance for the rotating retarders is found to be 127degrees. If exactly 16 intensity measurements are used for the calculation, we observe a complex relationship between the condition number and the size of the angular increments of the two retarders. If many intensity measurements are made, thus over-specifying the calculation, we find broad optimal ranges of angular increments of the two retarders that yield essentially equal performance.
引用
收藏
页码:31 / 36
页数:4
相关论文
共 50 条
  • [21] Axisymmetrical Mueller matrix polarimeter
    Wakayama, Toshitaka
    Otani, Yukitoshi
    Yoshizawa, Toru
    POLARIZATION SCIENCE AND REMOTE SENSING IV, 2009, 7461
  • [22] ERROR ANALYSIS OF A MUELLER MATRIX POLARIMETER
    GOLDSTEIN, DH
    CHIPMAN, RA
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1990, 7 (04): : 693 - 700
  • [23] Optimization of a snapshot Mueller matrix polarimeter
    Lemaillet, Paul
    Rivet, Sylvain
    Le Jeune, Bernard
    OPTICS LETTERS, 2008, 33 (02) : 144 - 146
  • [24] Robust characterization of small grating boxes using rotating stage Mueller matrix polarimeter
    Foldyna, M.
    De Martino, A.
    Licitra, C.
    Foucher, J.
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIV, 2010, 7638
  • [25] Imaging Stokes polarimeter by dual rotating retarder and analyzer and its application of evaluation of Japanese lacquer
    Mizutani, Ryota
    Ishikawa, Tomoharu
    Ayama, Miyoshi
    Otani, Yukitoshi
    OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II, 2012, 8563
  • [26] Imaging Stokes polarimeter by dual rotating retarder and analyzer and its application of evaluation of Japanese lacquer
    Graduate School of Engineering, Center for Optical Research and Education , Utsunomiya University, 7-1-2, Yoto, Utsunomiya, Tochigi, 321-8585, Japan
    Proc SPIE Int Soc Opt Eng,
  • [27] Model for the depolarizing retarder in Mueller matrix polarimetry
    Ossikovski, Razvigor
    Arteaga, Oriol
    Garcia-Caurel, Enrique
    Hingerl, Kurt
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2022, 39 (05) : 873 - 882
  • [28] Systematic errors for a Mueller matrix dual rotating compensator ellipsometer
    Broch, Laurent
    Naciri, Aotmane En
    Johann, Luc
    OPTICS EXPRESS, 2008, 16 (12): : 8814 - 8824
  • [29] A Study on the Optical Characteristics of Biaxial Film by using Dual Rotating Retarder Polarimeter and a Novel Simulation Model
    Yun, C. H.
    Jeon, Ba
    Park, M. S.
    Yu, J. S.
    IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS, 2006, : 809 - 813
  • [30] Polarization properties of PLZT under applied voltage measured by dual-rotating retarder polarimeter.
    Ginya, Makoto
    Mizutani, Yasuhiro
    Iwata, Tetsuo
    Otani, Yukitoshi
    INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN 2011), 2011, 19