Real-time image analysis of porcelain enamel defects

被引：0

作者：

Horton, M ^{[1
]}

Layne, CH ^{[1
]}

Evele, H ^{[1
]}

机构：

[1] Ferro Corp, Cleveland, OH 44114 USA

来源：

60TH PORCELAIN ENAMEL INSTITUTE TECHNICAL FORUM | 1998年 / 19卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The acquisition, analysis, and dissemination of defect images by electronic means are discussed.

引用

页码：37 / 40

页数：4

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