Real-time image analysis of porcelain enamel defects

被引：0
|
作者：
Horton, M [1 ]
Layne, CH [1 ]
Evele, H [1 ]
机构：
[1] Ferro Corp, Cleveland, OH 44114 USA
来源：
60TH PORCELAIN ENAMEL INSTITUTE TECHNICAL FORUM | 1998年 / 19卷 / 05期
关键词：
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The acquisition, analysis, and dissemination of defect images by electronic means are discussed.
引用
收藏
页码：37 / 40
页数：4
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