Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography

被引：19
|
作者：
Prosa, T. J. [1 ]
Lawrence, D. [1 ]
Olson, D. [1 ]
Larson, D. J. [1 ]
Marquis, E. A. [2 ]
机构：
[1] Imago Sci Instruments, Madison, WI 53711 USA
[2] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609093295
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：298 / 299
页数：2
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