AlGaN metal-semiconductor-metal ultraviolet photodetectors on sapphire substrate with a low-temperature AlN buffer layer

被引:6
|
作者
Zhang, Junqin [1 ]
Yang, Yintang [1 ]
Jia, Hujun [1 ]
机构
[1] Xidian Univ, Minist Educ, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
基金
中国国家自然科学基金;
关键词
LOW DARK CURRENT; I-N PHOTODIODES; MSM-PHOTODETECTORS; UV PHOTODETECTORS; HIGH DETECTIVITY; GAN; HETEROSTRUCTURES; VOLTAGE; MOCVD; HEMT;
D O I
10.3788/COL201311.102304
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Unintentionally doped AlGaN thin films are grown on c-plane (0001) sapphire substrate by metal-organic chemical vapor deposition, and low-temperature AlN is deposited onto sapphire substrate used as a buffer layer. AlGaN metal-semiconductor-metal ultraviolet photodetectors with Ni/Au interdigitated contact electrodes are then fabricated by lift-off technology. The dark current of the AlGaN photodetectors is 5.61x10(-9) A at 2-V applied bias and the peak response occurrs at 294 nm.
引用
收藏
页数:3
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