In this study, direct-current magnetron sputtering was used to fabricate Ti-doped indium tin oxide (ITO) thin films. The sputtering power during the 350-nm-thick thin-film production process was fixed at 100 W with substrate temperatures increasing from room temperature to 500 degrees C. The Ti-doped ITO thin films exhibited superior thin-film resistivity (1.5 x 10(-4) /cm), carrier concentration (4.1 x 10(21) cm(-3)), carrier mobility (10 cm(2)/Vs), and mean visible-light transmittance (90%) at wavelengths of 400-800 nm at a deposition temperature of 400 degrees C. The superior carrier concentration of the Ti-doped ITO alloys (>10(21) cm(-3)) with a high figure of merit (81.1 x 10(-3) (-1)) demonstrate the pronounced contribution of Ti doping, indicating their high suitability for application in optoelectronic devices.
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Technol Univ Panama, Fac Sci & Technol, Dept Nat Sci, Victor Levy Sasso Campus, Panama City, PanamaTechnol Univ Panama, Fac Sci & Technol, Dept Nat Sci, Victor Levy Sasso Campus, Panama City, Panama
Ching-Prado, E.
Watson, A.
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Technol Univ Panama, Fac Sci & Technol, Dept Nat Sci, Victor Levy Sasso Campus, Panama City, PanamaTechnol Univ Panama, Fac Sci & Technol, Dept Nat Sci, Victor Levy Sasso Campus, Panama City, Panama
Watson, A.
Miranda, H.
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Technol Univ Panama, Fac Sci & Technol, Dept Nat Sci, Victor Levy Sasso Campus, Panama City, PanamaTechnol Univ Panama, Fac Sci & Technol, Dept Nat Sci, Victor Levy Sasso Campus, Panama City, Panama