Noise Analysis for Interference Waveform in Swept Source Optical Coherence Tomography

被引：0
|
作者：
Sunaga, Hiroshi [1 ]
Endo, Kazuma [1 ]
Ogawa, Takafumi [1 ]
Shinagawa, Mitsuru [1 ]
Ueno, Masahiro [2 ]
Toyoda, Seiji [2 ]
Sasaki, Yuzo [2 ]
Chin, Meishin [2 ]
Sakamoto, Tadashi [2 ]
机构：
[1] Hosei Univ, Fac Sci & Engn, 3-7-2 Kajino Cho, Koganei, Tokyo 1848584, Japan
[2] NTT Corp, NTT Device Innovat Ctr, 3-1 Morinosato, Atsugi, Kanagawa 2430198, Japan
来源：
TENCON 2017 - 2017 IEEE REGION 10 CONFERENCE | 2017年
关键词：
SS-OCT; Simulation; Interference waveform; Voltage noise; Jitter; HIGH-SPEED; ULTRAHIGH-RESOLUTION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper describes a noise analysis of interference waveforms in swept source optical coherence tomography using a KTa1-XNbXO3 deflector. Noise reduction based on such analysis is needed for obtaining high-resolution images. The quality of the tomographic images depends on the signal-to-noise ratio (SNR) of the point spread functions (PSFs). The relationship between the noise of the interference waveform and the PSFs' SNR was investigated using a simulation. Two kinds of noise were revealed: voltage noise and jitter. We found that the PSFs' SNR deterioration caused by jitter was greater than that caused by voltage noise. We found that the PSFs' SNR is substantially limited by the typical jitter of 0.5 ns.
引用
收藏
页码：957 / 962
页数：6
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