A novel approach to microwave circuit large-signal variability analysis through efficient device sensitivity-based physical modeling

被引：0

作者：

Guerrieri, Simona Donati ^{[1
]}

Bonani, Fabrizio ^{[1
]}

Ghione, Giovanni ^{[1
]}

机构：

[1] Politecn Torino, Dipartimento Elettron & Telecomunicaz, Turin, Italy

来源：

2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) | 2016年

关键词：

Device variability; microwave amplifiers; TCAD sensitivity; NOISE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We propose a novel numerical approach for the microwave circuit variability analysis through efficient physics-based simulation of devices operated in nonlinear conditions. The proposed technique allows for a direct link between nonlinear circuit performances and technological parameter variations, and is validated against a class A and a deep class AB power amplifier example.

引用

页数：3

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