A novel approach to microwave circuit large-signal variability analysis through efficient device sensitivity-based physical modeling

被引：0
|
作者：
Guerrieri, Simona Donati [1 ]
Bonani, Fabrizio [1 ]
Ghione, Giovanni [1 ]
机构：
[1] Politecn Torino, Dipartimento Elettron & Telecomunicaz, Turin, Italy
来源：
2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) | 2016年
关键词：
Device variability; microwave amplifiers; TCAD sensitivity; NOISE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We propose a novel numerical approach for the microwave circuit variability analysis through efficient physics-based simulation of devices operated in nonlinear conditions. The proposed technique allows for a direct link between nonlinear circuit performances and technological parameter variations, and is validated against a class A and a deep class AB power amplifier example.
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页数：3
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