Temperature dependence of the minority-carrier mobility-lifetime product for probing band-tail states in microcrystalline silicon

被引：0
|
作者：
Brüggemann, R [1 ]
Kunz, O [1 ]
机构：
[1] Carl von Ossietzky Univ Oldenburg, Fachbereich Phys, D-26111 Oldenburg, Germany
来源：
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2002年 / 234卷 / 03期
关键词：
D O I：
10.1002/1521-3951(200212)234:3<R16::AID-PSSB999916>3.0.CO;2-6
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
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页码：R16 / R18
页数：3
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