Non-Contact PIM Measurement Method for Electrical Connection Inspection

被引:0
|
作者
Kuga, Nobuhiro [1 ]
Ohnishi, Ken-ichi [1 ]
机构
[1] Yokohama Natl Univ, Fac Engn, Hodogaya Ku, Yokohama, Kanagawa 2408501, Japan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A non-contact inspection method using electromagnetic intermodulation is proposed for electrical connections. It uses heavy intermodulation, which occurs at the connection with high current density. In the proposed method, a small probe at the tip of semi-rigid coaxial line excites the DUT and detects the intermodulation signal via the near field, which is effective to achieve high spatial resolution. In this paper, a small monopole and a small loop are used as the probes and their capability are examined through the experiments. The evaluation result of a packaged substrate is also shown as an application. To evaluate the capability of the proposed technique, an electrical contact is used as a defected connection. As a sample of other kinds of noise sources, the sample containing a ferromagnetic material in part is also evaluated. The results show that the loop-probe wrapping around the DUT is effective to detect the PIM source even in a continuous material, and the monopole-probe is effective to evaluate electrical-connection failures.
引用
收藏
页码:136 / 139
页数:4
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