Effect of oxygen environment on formation of modulated Ag nanostructures along the interface of a Ag-Si heterostructure

被引：4
|
作者：
Boyerinas, Brad M. [1 ]
Balsam, Joshua M. [1 ]
Bruck, Hugh A. [1 ]
Roytburd, Alexander L. [2 ]
机构：
[1] Univ Maryland, Dept Mech Engn, College Pk, MD 20742 USA
[2] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2013年 / 113卷 / 18期
基金：
美国国家科学基金会;
关键词：
THICK-FILM CONTACTS;
D O I：
10.1063/1.4803872
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Ag nanostructures were formed along the interface between Ag foil and Si wafer. These structures form when heated in the presence of air below the melting temperature of Ag, while heating above the melting temperature results in Ag foil melting with no nanostructure growth. Nanostructure morphology is determined by Si wafer orientation, while the size and periodicity of the structures depend on the duration of thermal processing. Electron backscatter diffraction (EBSD) analysis shows an epitaxial relation between Ag nanostructures and Si. Annealing specimens in vacuum above the Ag-Si eutectic but below pure Ag melting temperature results in solidification of melted foil without any interfacial nanostructure growth. (C) 2013 AIP Publishing LLC.
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页数：4
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