A 13b-ENOB Noise Shaping SAR ADC with a Two-Capacitor DAC

被引:0
|
作者
Shi, Lukang [1 ]
Zhang, Yi [1 ,2 ]
Wang, Yanchao [1 ]
Kareppagoudr, Manjunath [1 ]
Sadollahi, Mahmoud [1 ]
Temes, Gabor C. [1 ]
机构
[1] Oregon State Univ, Sch EECS, Corvallis, OR 97333 USA
[2] Analog Devices Inc, Woburn, MA 01801 USA
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents an active noise-shaping successive-approximation-register analog-to-digital converter. Instead of binary-weighted capacitors, it uses two equal-valued capacitors as a digital-to-analog converter (DAC). Thus, the capacitance spread in the DAC is 1, much smaller than that of the conventional binary-weighted capacitor array, and hence the mismatch error can be greatly reduced. The circuit provides first-order noise shaping, which can improve the ADC's linearity even for a small oversampling ratio (OSR). Also, the proposed architecture uses a monotonic switching procedure which allows fewer conversion steps than for a conventional SAR ADCs. The ADC was fabricated in 0.18 um CMOS technology. For a 2kHz bandwidth, it achieved a 78.8 dB SNDR. It consumes 74.2uW power from 1.5V power supply.
引用
收藏
页码:153 / 156
页数:4
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