Effect of the nand p-type Si(100) substrates with a SiC buffer layer on the growth mechanism and structure of epitaxial layers of semipolar AlN and GaN

被引:4
|
作者
Bessolov, V. N. [1 ,2 ]
Grashchenko, A. S. [1 ]
Konenkova, E. V. [1 ,2 ]
Myasoedov, A. V. [2 ]
Osipov, A. V. [1 ,3 ]
Red'kov, A. V. [1 ]
Rodin, S. N. [2 ]
Rubets, V. P. [4 ]
Kukushkin, S. A. [1 ,3 ]
机构
[1] Russian Acad Sci, Inst Problems Mech Engn, St Petersburg 199178, Russia
[2] Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[3] St Petersburg Natl Res Univ Informat Technol Mech, St Petersburg 197101, Russia
[4] Tech Univ, St Petersburg State Inst Technol, St Petersburg 190013, Russia
基金
俄罗斯科学基金会;
关键词
GALLIUM NITRIDE; SILICON; DIODES;
D O I
10.1134/S1063783415100042
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A new effect of the n-and p-type doping of the Si(100) substrate with a SiC film on the growth mechanism and structure of AlN and GaN epitaxial layers has been revealed. It has been experimentally shown that the mechanism of AlN and GaN layer growth on the surface of a SiC layer synthesized by substituting atoms on n- and p-Si substrates is fundamentally different. It has been found that semipolar AlN and GaN layers on the SiC/Si(100) surface grow in the epitaxial and polycrystalline structures on p-Si and n-Si substrates, respectively. A new method for synthesizing epitaxial semipolar AlN and GaN layers by chloride-hydride epitaxy on silicon substrates has been proposed.
引用
收藏
页码:1966 / 1971
页数:6
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