Electron bunch shape measurement using coherent diffraction radiation

被引：13
|
作者：
Feng, B
Oyamada, M
Hinode, F
Sato, S
Kondo, Y
Shibata, Y
Ikezawa, M
机构：
[1] Vanderbilt Univ, FEL Ctr, Nashville, TN 37212 USA
[2] Tohoku Univ, Fac Sci, Nucl Sci Lab, Sendai, Miyagi 982, Japan
[3] Tohoku Univ, Fac Agr, Dept Appl Phys, Sendai, Miyagi 980, Japan
[4] Tohoku Univ, Sci Measurements Res Inst, Sendai, Miyagi 980, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 475卷 / 1-3期
关键词：
free electron laser; electron bunch shape; polychrometer; coherent diffraction radiation;
D O I：
10.1016/S0168-9002(01)01605-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Coherent diffraction radiation, generated by relativistic electron bunches passing through an aperture in a metallic foil, has been studied to diagnose the beam bunch shapes at the Tohoku 300 MeV linear accelerator. Using a polychrometer and fast data conversion method from frequency to time domain, we are able to realize a real-time, nonintercepting beam bunch shape diagnosis. The initial experimental results are presented. (C) 2001 Published by Elsevier Science B.V.
引用
收藏
页码：492 / 497
页数：6
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