Electron bunch shape measurement using coherent diffraction radiation

被引：13

作者：

Feng, B

Oyamada, M

Hinode, F

Sato, S

Kondo, Y

Shibata, Y

Ikezawa, M

机构：

[1] Vanderbilt Univ, FEL Ctr, Nashville, TN 37212 USA

[2] Tohoku Univ, Fac Sci, Nucl Sci Lab, Sendai, Miyagi 982, Japan

[3] Tohoku Univ, Fac Agr, Dept Appl Phys, Sendai, Miyagi 980, Japan

[4] Tohoku Univ, Sci Measurements Res Inst, Sendai, Miyagi 980, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 475卷 / 1-3期

关键词：

free electron laser; electron bunch shape; polychrometer; coherent diffraction radiation;

D O I：

10.1016/S0168-9002(01)01605-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Coherent diffraction radiation, generated by relativistic electron bunches passing through an aperture in a metallic foil, has been studied to diagnose the beam bunch shapes at the Tohoku 300 MeV linear accelerator. Using a polychrometer and fast data conversion method from frequency to time domain, we are able to realize a real-time, nonintercepting beam bunch shape diagnosis. The initial experimental results are presented. (C) 2001 Published by Elsevier Science B.V.

引用

页码：492 / 497

页数：6

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