AN EFFICIENT FUNCTIONAL TEST GENERATION METHOD FOR PROCESSORS USING GENETIC ALGORITHMS

被引：8
|
作者：
Hudec, Jan [1 ]
Gramatova, Elena [1 ]
机构：
[1] Slovak Univ Technol Bratislava, Fac Informat & Informat Technol, Bratislava 84216, Slovakia
来源：
JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS | 2015年 / 66卷 / 04期
关键词：
processor; testing; functional test; test generation; genetic algorithm; evolutionary strategy;
D O I：
10.2478/jee-2015-0031
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper presents a new functional test generation method for processors testing based on genetic algorithms and evolutionary strategies. The tests are generated over an instruction set architecture and a processor description. Such functional tests belong to the software-oriented testing. Quality of the tests is evaluated by code coverage of the processor description,using simulation. The presented test generation method uses VHDL models of processors and the professional simulator ModelSim. The rules, parameters and fitness functions were defined for various genetic algorithms used in automatic test generation. Functionality and effectiveness were evaluated using the RISC type processor DP32.
引用
收藏
页码：185 / 193
页数：9
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