Embedded built-in-test detection circuit for radio frequency systems and circuits

被引：0

作者：

Zhang, Guoyan ^{[1
]}

Farrell, Ronan ^{[1
]}

机构：

[1] Natl Univ Ireland, Inst Microelect & Wireless Syst, Maynooth, Kildare, Ireland

来源：

PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS | 2006年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

An embedded rectifier-based Butit-In-Test (BIT) detection circuit for the RF integrated circuits is proposed, and charge pump rectifier is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn't consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier has been verified by using this BIT detection circuit, and gain and linearity are extracted.

引用

页码：89 / +

页数：2

共 50 条

[31] TRL-based Measurement of Embedded Circuits in Microwave Printed Circuit Boards Including Frequency Conversion
Ourednik, Petr
Hudec, Premysl
RADIOENGINEERING, 2018, 27 (04) : 1077 - 1084
[32] Electrical Interconnect Test of 3D ICs Made of Dies without ESD Protection Circuits with a Built-in Test Circuit
Nanbara, Kosuke
Odoriba, Akihiro
Hashizume, Masaki
Yotsuyanagi, Hiroyuki
Lu, Shyue-Kung
2015 INTERNATIONAL 3D SYSTEMS INTEGRATION CONFERENCE (3DIC 2015), 2015,
[33] Open Defect Detection with a Built-in Test Circuit by IDDT Appearance Time in CMOS ICs
Kambara, Ayumu
Yotsuyanagi, Hiroyuki
Miyoshi, Daichi
Hashizume, Masaki
Lu, Shyue-Kung
2017 IEEE 26TH ASIAN TEST SYMPOSIUM (ATS), 2017, : 237 - 242
[34] Built-in test of frequency modulated RF transmitters using embedded low-pass filters
Senguttuvan, Rajarajan
Choi, Hyun
Han, Donghoon
Chatterjee, Abhijit
PROCEEDINGS OF THE 13TH IEEE EUROPEAN TEST SYMPOSIUM: ETS 2008, 2008, : 41 - 46
[35] Using Remote Update Controller of FPGA's as Built-in Self Test for Embedded Systems
Stoerte, Christian
2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE), 2013, : 500 - 501
[36] Test Frequency Compaction for Fault Detection in Analog Circuits Using Sensitivity Analysis
Adha, Ajaykumar
Nourani, Mehrdad
PROCEEDINGS OF THE 2018 IEEE 13TH DALLAS CIRCUITS AND SYSTEMS CONFERENCE (DCAS), 2018,
[37] Design of sensor-embedded radio frequency identification (SE-RFID) systems
Deng, Hai
Varanasi, Murali
Swigger, Kathleen
Garcia, Oscar
Ogan, Ron
Kougianos, Elias
IEEE ICMA 2006: PROCEEDING OF THE 2006 IEEE INTERNATIONAL CONFERENCE ON MECHATRONICS AND AUTOMATION, VOLS 1-3, PROCEEDINGS, 2006, : 792 - +
[38] Combined 3D FE and circuit modeling of radio frequency heating systems
Neophytou, RI
Metaxas, AC
JOURNAL OF MICROWAVE POWER AND ELECTROMAGNETIC ENERGY, 1998, 33 (04) : 243 - 262
[39] Two new techniques for identifying opens on printed circuit boards: Analog junction test, and radio frequency induction test
Wrinn, J
INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 927 - 927
[40] Significant Cycle Frequency based Feature Detection for Cognitive Radio Systems
Shen Da
Gan Xiaoying
Chen Hsiao-Hwa
Qian Liang
Xu Miao
2009 4TH INTERNATIONAL CONFERENCE ON COGNITIVE RADIO ORIENTED WIRELESS NETWORKS AND COMMUNICATIONS, 2009, : 267 - +

← 1 2 3 4 5 →