Embedded built-in-test detection circuit for radio frequency systems and circuits

被引：0

作者：

Zhang, Guoyan ^{[1
]}

Farrell, Ronan ^{[1
]}

机构：

[1] Natl Univ Ireland, Inst Microelect & Wireless Syst, Maynooth, Kildare, Ireland

来源：

PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS | 2006年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

An embedded rectifier-based Butit-In-Test (BIT) detection circuit for the RF integrated circuits is proposed, and charge pump rectifier is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn't consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier has been verified by using this BIT detection circuit, and gain and linearity are extracted.

引用

页码：89 / +

页数：2

共 50 条

[11] BUILT-IN-TEST FOR CIRCUITS WITH SCAN BASED ON RESEEDING OF MULTIPLE-POLYNOMIAL LINEAR FEEDBACK SHIFT REGISTERS
HELLEBRAND, S
RAJSKI, J
TARNICK, S
VENKATARAMAN, S
COURTOIS, B
IEEE TRANSACTIONS ON COMPUTERS, 1995, 44 (02) : 223 - 233
[12] Coupled circuit/EM simulation for radio frequency circuits
Bittner, Kai
Brachtendorf, H. G.
Schoenmaker, Wim
Reynier, Pascal
PROCEEDINGS OF THE 2017 54TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2017,
[13] Designing built-in self-test circuits for embedded memories test
Park, S
Lee, K
Im, C
Kwak, N
Kim, K
Choi, Y
PROCEEDINGS OF THE SECOND IEEE ASIA PACIFIC CONFERENCE ON ASICS, 2000, : 315 - 318
[14] On built-in-test classes for object-oriented and component-based information systems
Wang, YX
Patel, S
Patel, D
OOIS 2001: 7TH INTERNATIONAL CONFERENCE ON OBJECT-ORIENTED INFORMATION SYSTEMS, PROCEEDINGS, 2001, : 307 - 316
[15] Mission reliability of an automatic control system integrated with distributed intelligent built-in-test systems
Yoo, WJ
Jung, KH
COMPUTERS & INDUSTRIAL ENGINEERING, 1997, 33 (3-4) : 753 - 756
[16] Principles of Built-In-Test for Run-Time-Testability in Component-Based Software Systems
Jonathan Vincent
Graham King
Peter Lay
John Kinghorn
Software Quality Journal, 2002, 10 : 115 - 133
[17] Principles of built-in-test for run-time-testability in component-based software systems
Vincent, J
King, G
Lay, P
Kinghorn, J
SOFTWARE QUALITY JOURNAL, 2002, 10 (02) : 115 - 133
[18] On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference
Aiello, Orazio
Fiori, Franco
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2012, 54 (02) : 405 - 412
[19] Specification based digital compatible built-in test of embedded analog circuits
Halder, A
Chatterjee, A
10TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2001, : 344 - 349
[20] Integrated Stateflow-based simulation modelling and testability evaluation for electronic built-in-test (BIT) systems
Shi, Junyou
He, Qingjie
Wang, Zili
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2020, 202

← 1 2 3 4 5 →