Role of the functional groups of complexing agents in copper slurries

被引:48
|
作者
Patri, Udaya B. [1 ]
Aksu, Serdar
Babu, S. V.
机构
[1] Clarkson Univ, Dept Chem Engn, Potsdam, NY 13699 USA
[2] Clarkson Univ, Ctr Adv Mat Proc, Potsdam, NY 13699 USA
[3] ASM NuTool Inc, Fremont, CA 94358 USA
关键词
D O I
10.1149/1.2199307
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
We investigate the role of -NH2 and -COOH functional groups of complexing agents in H2O2-based slurries in controlling copper (Cu) removal rates. Slurries containing complexing agents with two of the same functional groups (succinic acid: HOOC-CH2CH2-COOH, ethylene diamine: H2N-CH2CH2-NH2) and a complexing agent containing one each of the functional groups (beta-alanine: H2N-CH2CH2-COOH), all with the same carbon chain length, were investigated. Along with dissolution and disk polish experiments, potential-pH diagrams were constructed for these three systems in the presence of H2O. The dissolution and polish rates are consistent with the known activity of carboxylic acids (with -COOH groups) at acidic conditions and that of amines (with -NH2 groups) in an alkaline environment. The observed trends in the removal rates with all these slurries are explained using potential-pH diagrams, UV/visible spectra, and electrochemical experiments. When compared to glycine (H2N-CH2-COOH), beta-alanine (H2N-CH2CH2-COOH) produced higher removal rates at acidic pH values and lower removal rates at alkaline pH values. Finally, succinic acid and beta-alanine-based slurries were found to result in lower dissolution rates and higher polish rates compared to glycine-based slurries at pH 4. (c) 2006 The Electrochemical Society.
引用
收藏
页码:G650 / G659
页数:10
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