Measuring dispersion characteristics of elliptical-core optical fiber using white-light spectral interferometry

被引:0
|
作者
Hlubina, P [1 ]
Martynkien, T
Urbanczyk, W
机构
[1] Silesian Univ Opava, Inst Phys, Bezrucovo Nam 13, Opava 74601, Czech Republic
[2] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland
关键词
white-light source; spectral interference; Michelson interferometer; elliptical-core optical fiber; equalization wavelength; birefringence dispersion; intermodal dispersion;
D O I
10.1117/12.675769
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
A spectral-domain white-light interferometric technique employing a low-resolution spectrometer is used for measuring dispersion characteristics of a two-mode elliptical-core optical fiber. The technique utilizes the fact that the spectral interference fringes axe resolved at the output of a tandem configuration of a Michelson interferometer and a two-mode optical fiber under test only in the vicinities of so-called equalization wavelengths at which the optical path difference (OPD) in the interferometer is the same as the intermodal or differential group OPD. Measuring the OPD adjusted in the interferometer as a function of the equalization wavelength serves for dispersion characterization of the optical fiber guiding two spatial modes in two polarizations. We measured the dispersion of the intermodal group OPD between the LP01 and LP11 spatial modes, which were X-polarized or Y-polarized, and the dispersion of the group modal birefringence for the LP01 and LP11 spatial modes. The measured data were fitted to polynomials to obtain the dispersions of both the differences between propagation constants of the LP modes and the phase modal birefringences.
引用
收藏
页数:8
相关论文
共 50 条
  • [31] White-light spectral interferometry with the equalization wavelength determination used to measure group velocity dispersion in optical samples
    Hlubina, P
    [J]. PHOTONICS, DEVICES, AND SYSTEMS II, 2003, 5036 : 165 - 170
  • [32] A New Method of Measuring Localized Chromatic Dispersion of Structured Nanowaveguide Devices Using White-Light Interferometry
    Kim, Dong Wook
    Kim, Seung Hwan
    Lee, Seoung Hun
    Kim, Kyong Hon
    Lee, Jong-Moo
    Lee, El-Hang
    [J]. JOURNAL OF LIGHTWAVE TECHNOLOGY, 2012, 30 (01) : 43 - 48
  • [33] Dispersion of optical vortices in twisted elliptical-core optical fibers with torsional stresses
    Lapin, B. P.
    Barshak, E. V.
    Vikulin, D. V.
    Alexeyev, C. N.
    Yavorsky, M. A.
    [J]. COMPUTER OPTICS, 2024, 48 (01) : 53 - 60
  • [34] Optical roughness measurements using extended white-light interferometry
    Windecker, R
    Tiziani, HJ
    [J]. OPTICAL ENGINEERING, 1999, 38 (06) : 1081 - 1087
  • [35] Variable effective thickness of beamsplitter cube and dispersion error in white-light spectral interferometry
    Hlubina, P.
    Lunacek, J.
    Ciprian, D.
    Chlebus, R.
    [J]. 16TH POLISH-SLOVAK-CZECH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2008, 7141
  • [36] CHROMATIC DISPERSION MEASUREMENT BY WHITE-LIGHT INTERFEROMETRY ON METER-LENGTH SINGLE-MODE OPTICAL FIBER
    SHANG, HT
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (12) : 1587 - 1587
  • [37] FRINGE ORDER IDENTIFICATION IN OPTICAL FIBER WHITE-LIGHT INTERFEROMETRY USING CENTROID ALGORITHM METHOD
    CHEN, S
    PALMER, AW
    GRATTAN, KTV
    MEGGITT, BT
    [J]. ELECTRONICS LETTERS, 1992, 28 (06) : 553 - 555
  • [38] Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry
    Ye, QH
    Xu, C
    Liu, X
    Knox, WH
    Yan, MF
    Windeler, RS
    Eggleton, B
    [J]. APPLIED OPTICS, 2002, 41 (22) : 4467 - 4470
  • [39] Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry
    Ye, Q
    Xu, C
    Liu, X
    Knox, WH
    Yan, M
    Windeler, RS
    Eggleton, BJ
    [J]. APOC 2001: ASIA-PACIFIC OPTICAL AND WIRELESS COMMUNICATIONS: OPTICAL FIBER AND PLANAR WAVEGUIDE TECHNOLOGY, 2001, 4579 : 251 - 255
  • [40] Versatile chromatic dispersion measurement of a single mode fiber using spectral white light interferometry
    Lee, J. Y.
    Kim, D. Y.
    [J]. OPTICS EXPRESS, 2006, 14 (24): : 11608 - 11615