Measuring dispersion characteristics of elliptical-core optical fiber using white-light spectral interferometry

被引:0
|
作者
Hlubina, P [1 ]
Martynkien, T
Urbanczyk, W
机构
[1] Silesian Univ Opava, Inst Phys, Bezrucovo Nam 13, Opava 74601, Czech Republic
[2] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland
关键词
white-light source; spectral interference; Michelson interferometer; elliptical-core optical fiber; equalization wavelength; birefringence dispersion; intermodal dispersion;
D O I
10.1117/12.675769
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
A spectral-domain white-light interferometric technique employing a low-resolution spectrometer is used for measuring dispersion characteristics of a two-mode elliptical-core optical fiber. The technique utilizes the fact that the spectral interference fringes axe resolved at the output of a tandem configuration of a Michelson interferometer and a two-mode optical fiber under test only in the vicinities of so-called equalization wavelengths at which the optical path difference (OPD) in the interferometer is the same as the intermodal or differential group OPD. Measuring the OPD adjusted in the interferometer as a function of the equalization wavelength serves for dispersion characterization of the optical fiber guiding two spatial modes in two polarizations. We measured the dispersion of the intermodal group OPD between the LP01 and LP11 spatial modes, which were X-polarized or Y-polarized, and the dispersion of the group modal birefringence for the LP01 and LP11 spatial modes. The measured data were fitted to polynomials to obtain the dispersions of both the differences between propagation constants of the LP modes and the phase modal birefringences.
引用
收藏
页数:8
相关论文
共 50 条