Single Bit-line Low Power 9T Static Random Access Memory

被引:0
|
作者
Inamdar, Akshatha P. [1 ]
Divya, P. A. [1 ]
Aradhya, H. V. Ravish [2 ]
机构
[1] RV Coll Engn, VLSI Design & Embedded Syst, Bangalore 560059, Karnataka, India
[2] RV Coll Engn, Dept Elect & Commun, Bangalore 560059, Karnataka, India
关键词
Single bit-line; Low power operation; Static Noise Margin; 9T SRAM;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The Static random access memory (SRAM) design is demanding due to the variation of the process parameters with CMOS technology scaling. It becomes challenging because the stability, write ability and leakage power consumption should all be considered to provide an optimum performance. The proposed cell consumes 8.54% less power compared to double bit-line SRAM. The 2 bit-line scheme of SRAM has more dissipation of power due to the charging and discharging of complementary bit lines. This paper puts forth a single bit-line 9T SRAM design which consumes lower power and low leakage. It has a high read SNM with good static and dynamic read/write performance. Single bit-line approach leads to lower power consumption compared to the conventional 2 bit-line SRAMs. However, the access time for read and write operation is increased.
引用
收藏
页码:1943 / 1947
页数:5
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