Electron tomography in solid state and materials science - An Introduction

被引：5

|

作者：

Midgley, Paul A. ^{[1
]}

Saghi, Zineb ^{[1
]}

机构：

[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

来源：

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 2013年 / 17卷 / 03期

关键词：

DIFFRACTION TOMOGRAPHY; Z-CONTRAST; 3D; CRYSTAL; MICROSCOPY; STEM; RESOLUTION;

D O I：

10.1016/j.cossms.2013.07.006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：89 / 92

页数：4

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