Neutron reflectometry in solid state and materials science

被引：7
|
作者：
Thomas, RK
机构：
[1] Phys. and Theor. Chem. Laboratory, University of Oxford, Oxford, OX1 3QZ, South Parks Road
来源：
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 1996年 / 1卷 / 05期
关键词：
D O I：
10.1016/S1359-0286(96)80045-3
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Neutron specular reflectometry has emerged as a highly effective technique for studying the structure of open and buried interfaces. it is particularly useful when the interface is somewhat disordered, as in polymer systems, or complex, as in many composite structures, and it is also able to study magnetism in thin films. (C) Current Chemistry Ltd
引用
收藏
页码：636 / 644
页数：9
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