Electron tomography in solid state and materials science - An Introduction

被引：5
|
作者：
Midgley, Paul A. [1 ]
Saghi, Zineb [1 ]
机构：
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
来源：
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 2013年 / 17卷 / 03期
关键词：
DIFFRACTION TOMOGRAPHY; Z-CONTRAST; 3D; CRYSTAL; MICROSCOPY; STEM; RESOLUTION;
D O I：
10.1016/j.cossms.2013.07.006
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：89 / 92
页数：4
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